Here is a concise summary of the text:
**Title:** USB Killer 3.0 vs. Various Devices
**Summary:**
* The creator tests the "USB Killer 3.0", a device designed to destroy technology, on various devices.
* **Electromagnetic Pulse (EMP) Test:**
+ Google Pixel 2: Minor slowing and unresponsiveness
+ Samsung Galaxy Note 8: Display flicker, but remains functional
+ iPhone 10 Clone: Severely affected, but recovers
+ Nokia 3310: Unaffected
* **USB Killer 3.0 Test:**
+ Nokia 3310: Unaffected (expected, as it only receives charge)
+ iPhone 8: **Destroyed** (Lightning port fried)
+ iPhone 10 Clone: Survived (no charge produced)
+ Galaxy Note 8: Resistant (failed to produce spark)
+ Google Pixel 2 XL: **Destroyed** (instant freeze and death)
**Note:** The creator emphasizes the dangers of the USB Killer 3.0 and warns against using it.
Here are the extracted key facts, each with a number and in short sentences, excluding opinions:
**Device Testing Facts**
1. Devices tested: Google Pixel 2, Samsung Galaxy Note 8, iPhone 10 clone, iPhone 8, and Nokia 3310.
2. Two testing tools used: EMP (Electromagnetic Pulse) device and USB Killer 3.0.
**EMP Testing Results**
3. Google Pixel 2: Became slow and unresponsive, but display was not heavily affected.
4. Samsung Galaxy Note 8: Display flickered, but the phone remained awake and functional.
5. iPhone 10 clone: Was affected, with a bad display flicker, but initially stayed alive.
6. Nokia 3310: Not affected by the EMP device.
7. iPhone 8: Not specified to be tested with the EMP device in the provided text.
**USB Killer 3.0 Testing Results**
8. Nokia 3310: Not affected by the USB Killer 3.0.
9. iPhone 8: Lightning port got fried, preventing charging, but the phone's other functions initially remained.
10. iPhone 10 clone: No charge was produced, and the phone survived the test.
11. Samsung Galaxy Note 8: Resistant to the USB Killer 3.0, with no significant effect.
12. Google Pixel 2 XL: Killed by the USB Killer 3.0, with the phone freezing and becoming unresponsive to power on.